| 姓 名 | 李宜真 |
|---|---|
| 職 稱 | 副教授 |
| 專長領域 | 可靠度分析、工業統計、貝氏分析 |
| 電子信箱 | iclee@ncku.edu.tw |
| 辦公室 | 管理學院統計系館4樓62449室 |
| 聯絡電話 | (06)2757575~53642 |
| 個人網頁 | https://researchoutput.ncku.edu.tw/zh/persons/i-chen-lee |
- 成功大學統計學系副教授(2022.08-目前)
- 成功大學統計學系助理教授(2017.08-2022.07)
- 清華大學統計研究所博士後研究員(2016.11-2017.07)
- 國立清華大學統計研究所博士
- 國立清華大學統計研究所碩士
- 國立中山大學應用數學系學士
- 可靠度分析
- 工業統計
- 產品可靠度之衰變資料分析
- 加速試驗之最適實驗設計
- Batch sequential designs for accelerated life tests and an application to polymer composite fatigue test
Tung, H. P., Lee, I. C., Hong, Y., Tseng, S. T. & Wang, B. X., 2020, (Accepted/In press) In: Quality Engineering. - Global planning of accelerated degradation tests based on exponential dispersion degradation models
Lee, I. C., Tseng, S. T. & Hong, Y., 2020 Sep, In : Naval Research Logistics. 67, 6, p. 469-483 15 p. -
Sequential Bayesian Design for Accelerated Life Tests
Lee, I. C., Hong, Y., Tseng, S. T. & Dasgupta, T., 2018 Oct 2, In : Technometrics. 60, 4, p. 472-483 12 p. -
A multivariate EWMA controller for linear dynamic processes
Tseng, S. T., Mi, H. C. & Lee, I-C., 2016 Jan 2, In : Technometrics. 58, 1, p. 104-115 12 p. -
Optimum Allocation Rule for Accelerated Degradation Tests with a Class of Exponential-Dispersion Degradation Models
Tseng, S. T. & Lee, I-C., 2016 Apr 2, In : Technometrics. 58, 2, p. 244-254 11 p.
研討會論文
1.
Batch sequential designs for accelerated life tests and an application to polymer composite fatigue test
Lee, I. C. & Lin, Z. Y., 2020 Aug, 2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020. Institute of Electrical and Electronics Engineers Inc., 9209379. (2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020).
- 106年度中華機率統計學會魏慶榮統計論文獎特優(2017)
- 第四屆台聯大學生論文獎(2016)
- 中國統計學社論文獎(2011)